기기명 (Instrument) : NonNon-Contact Resistivity Tester
제작회사 (Manufacturer) : NAPSON
형식 (Model) : EC-80P
세부내용 (Description) :
특징
- Rs : 0.01~3000Ω/sq
- Res : 0.001~200Ω·cm
- Applications : Silicon wafer, GaAs Epi, GaN, GaP, InP, ITO and metal layers
- Size : Any kinds of sizes (more than 14 mm)
상세설명
- Hand held eddy current probe measurement instrument
- 3 Measurement modes for wafer resistivity, bulk resistivity and sheet resistance
- Resistivity probe can be changed by sample's range
- Possible to add PN measurement probe (EC-80P-PN)
- 5 types of model for each measuring range
- Res : Low – 0.001~0.05 Ω·cm
Middle – 0.05~0.5 Ω·cm
High – 0.5~60 Ω·cm
Super High – 60~200 Ω·cm
Solar Wafer – 0.2~15 Ω·cm
- Rs : Low – 0.01~0.5 Ω/sq
Middle – 0.5~10 Ω/sq
High – 10~1000 Ω/sq
Super High – 1000~3000 Ω/sq
Solar - 5~500 Ω/sq
첨부 (Attach)
파일내용 (The content of file) :
사진 (Picture) :
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